希捷U6 系列 有红绿块 或者少量坏道 可以通过自校进行修复 自校流程很重要
下面列表出U6 自校流程:
4 Latch
5 Hystersis
6 Head switch
7 Check AFC weights
8 PES screen and RRO ZAP
9 ROM Flashing
B Seek Settling Adaption
C Adaptive notch resonance analysis Test
D Adaptive notch resonance analysis Test
E Constant Velocity Seek test (test for frict
F Decon/Depop/VSS Scheme for Pes screen test
10 MR offset tuning VGA
11 Write current tuning
13 WP tuning for all zones
14 Read Bias head degradation test
15 VGA tuning
16 Capacity tuning
17 Variable Spare Sector tuning
18 Write Precomp at zone 7
19 VGA tuning
1A FB and FC tuning
1B FB and FC tuning
1C WP tuning for all zones
1D MR offset tuning BER
1E VGA tuning
1F Head data collection
20 Access time
21 Generate AT zone related settings
23 Start-stop / Time to ready
24 Latch Exerciser
25 Track Encroachment
26 Wide head test
27 28 Seek Error Rate
29 Two Point Seek Test
2A Drive Model Name Modification
2B Servo VGA tuning
2C Skew setting test
2D Reskew drive at AT rom age (use as a diagnostic command)
30 Build defect table ¡¾½¨Á¢È±ÏÝ±í¡¿
31.32 Normal Defect scan ¡¾È±ÏÝÕý³£É¨Ãè¡¿
33 PES Summary Test
34,38 Super Sector Scan Summary Test
35,36 Normal Defect Scan Summary Test
37 Left Adjacent Sector Pad
39 Super Sector Scan for Short ‑ Deep Defect
3A Super Sector Scan for Wide Shallow Defect
3B Circumferential Scratch Pad and Filling
3C Log Analysis¡¾LOG·ÖÎö¡¿
3D Radial Scratch Pad and Filling
3E Build Final Defect Table
3F AT Rom Flashing ¡¾Ð´ÈëAT-ROM¡¿
40 ROM Head Map Flashing, Cert/AT secondary overlays check¡¾´ÅÍ·µØÍ¼Ð´Èë 02ºÅÄ£¿é¼ì²é¡¿
41 Parameters for error limits
42 Error rate by zone/by head
43 ECC
44 Sequential Read Pass
46 Data transfer rate
48 Seek Error Rate
49 Head data collection ¡¾¾ÀÕý´ÅÍ·Êý¾Ý¡¿
4A Random Write/Read¡¾Ëæ»ú¶Áд²âÊÔ¡¿
4B ID Read ¡¾ID¶ÁÈ¡¡¿
4C Read Pack
4D Read/Compare 00 pattern
4E Log checking / Log summary ¡¾LOG¸ÅÒª¼°¼ì²â¡¿
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